18 ROUTING N/A
18.1.P Is there a procedure for the final route/contour process that addresses the following:
18.1.1.P Cutter compensation? YES/NO
18.1.2.P Stack height parameters? YES/NO
18.1.3.P Feed and speed parameters? YES/NO
18.1.4.P Handling parameters? YES/NO
18.1.5.P Plunge point offset or double pass to minimize crazing and dust build-up? YES/NO
18.1.6.P Cutter size and style? YES/NO
ROUTING COMPLIANCE
18.1.C Is there a vacuum system present at the point of contact during the cutting process? YES/NO
18.2.C Is cutter wear monitored and compensated for? YES/NO
18.3.C Is there a verification of cutter bit size(s) and style for each lot processed? YES/NO
18.4.C Is there a verification of first piece set up for each new lot processed? YES/NO
18.5.C Is there a verification of tab size and placement per Customer requirements? YES/NO
18.6.C Is there a unique identification for each program? YES/NO
18.7.C Is there objective evidence of configuration and revision control of downloaded programs?
YES/NO
18.8.C Is there a backup material used for each spindle position? YES/NO
18.9.C Is the operator prevented from overriding the recommended cutter feed and speed rates? YES/NO
18.10.C Are offsets, cutter feeds and speeds controlled? YES/NO
18.11.C Is there an inspection of the PB for countersink depth/diameter? YES/NO
18.12.C Is there an inspection of the PB for counterbore depth/diameter? YES/NO
18.13.C If chamfering is used, is there an inspection of the PB for chamfer requirements? YES/NO/N/A
18.14.C If the V-groove process is used, is there an inspection of the PB for V-groove depth? YES/NO/N/A
18.15.C Is there a cleaning step following fabrication? YES/NO
18.16.C Is preventative maintenance performed on the vacuum system? YES/NO
19 ELECTRICAL TEST N/A
19.1.P Is there a procedure covering all means of electrical test, which include the establishment of all voltage, open and short thresholds? YES/NO
19.2.P Is there a procedure for the analysis of electrical test failures, which includes failure analysis, non-conformance assessment and mandates for documented corrective actions? YES/NO
19.3.P Is there a requirement that only engineering source file data is used to generate the Electrical Test program? YES/NO
19.4.P If performed, is there a procedure for High-pot-testing? YES/NO/N/A
19.5.P If performed, is there a procedure for impedance testing? YES/NO/N/A
19.6.P Is there a procedure for Electrical Continuity and Isolation Resistance testing? YES/NO
19.7.P Is there a procedure for Dielectric Withstanding Voltage testing? YES/NO
19.8.P Is there a procedure for Moisture and Insulation Resistance (MIR) testing? YES/NO
19.9.P Is there a procedure for Dielectric Withstanding Voltage testing after MIR testing? YES/NO
19.10.P If performed, is there a procedure for testing buried resistance per Customer
requirements? YES/NO/N/A
19.11.P If performed, is there a procedure for testing functional capacitance of a PB? YES/NO /N/A
ELECTRICAL TEST COMPLIANCE
One of the following two questions (19.1.C or 19.2.C) shall be answered; both cannot be marked N/A:
19.1.C If net list testing is Customer supplied, are all end points tested? YES/NO/N/A
19.2.C If net list testing is generated internally, are all end points tested? YES/NO/N/A
19.3.C If required by the Customer, are all via midpoints tested? YES/NO/N/A
19.4.C Is the net list generated from only engineering source file data? YES/NO
19.5.C Is the extracted net list compared to the original data? YES/NO
19.6.C Are test yields monitored and reviewed? YES/NO
19.6.1.C Is there objective evidence that the review of test yields initiates appropriate corrective actions? YES/NO
19.7.C Is there objective evidence that all established voltage, open and short thresholds are being controlled per the procedure? YES/NO
19.8.C Is there objective evidence that the tests were 100% passing, with no assumed false negatives? YES/NO
19.9.C If failed PB’s are reintroduced as good PB’s, have they passed all test requirements(100% coverage)? YES/NO/N/A
19.10.C If performed, is there objective evidence that the procedure for high-pot testing is being followed? YES/NO/N/A
19.11.C If performed, is there objective evidence that the procedure for controlled impedance testing is being followed? YES/NO/N/A
19.12.C Is there objective evidence that the procedure for Electrical Continuity and Isolation Resistance testing is being followed? YES/NO
19.13.C Is there objective evidence that the procedure for Dielectric Withstanding Voltage testing is being followed? YES/NO
19.14.C Is there objective evidence that the procedure for Moisture and Insulation Resistance (MIR) testing is being followed? YES/NO
19.15.C Is there objective evidence that the procedure for Dielectric Withstanding Voltage testing after MIR testing is being followed? YES/NO
19.16.C If required by Customer, is the procedure for testing buried resistance per Customer requirements? YES/NO/N/A
19.17.C If required by Customer, is the procedure for testing functional capacitance of a PB per Customer requirements? YES/NO/N/A